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* mtd: tests: fix read, speed and stress tests on NOR flashMorten Thunberg Svendsen2010-01-133-3/+16
| | | | | | | | | | Before using block_isbad() check if mtd->block_isbad() is defined. Calculating pgcnt must be done using pgsize defined to 512 on NOR and mtd->writesize for NAND, not using mtd->writesize directly. Signed-off-by: Morten Thunberg Svendsen <mts.doredevelopment@gmail.com> Acked-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
* mtd: make pagetest workArtem Bityutskiy2009-11-301-0/+1
| | | | | | | | | The mtd_pagetest test did not initialize the pgsize variable, which basically means it did not work. This problem was reported by Török Edwin <edwintorok@gmail.com> Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
* mtd: add nand_ecc test moduleAkinobu Mita2009-11-302-0/+88
| | | | | | | | | | | | | | | | This module tests NAND ECC functions. The test is simple. 1. Create a 256 or 512 bytes block of data filled with random bytes (data) 2. Duplicate the data block and inject single bit error (error_data) 3. Try to correct error_data 4. Compare data and error_data Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Acked-by: Vimal Singh <vimalsingh@ti.com> Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
* mtd: cleanup mtd_oobtestAkinobu Mita2009-10-171-14/+4
| | | | | | | | | | | - Remove unnecessary memset for bbt All entries will be initialized at a few lines below - Remove unnecessary initialization for mtd->erasesize - Use write_whole_device() Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
* mtd: tests: fix read buffer overflowsRoel Kluin2009-09-042-7/+7
| | | | | | | | Check whether index is within bounds before testing the element. Signed-off-by: Roel Kluin <roel.kluin@gmail.com> Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
* trivial: NULL noise: drivers/mtd/tests/mtd_*test.cHannes Eder2009-03-302-13/+13
| | | | | | | | | | | | | | | | | | | | | Fix this sparse warnings: drivers/mtd/tests/mtd_oobtest.c:139:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:192:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:219:41: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:284:25: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:525:25: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:545:25: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:569:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:589:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:613:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:633:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:673:41: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_oobtest.c:701:33: warning: Using plain integer as NULL pointer drivers/mtd/tests/mtd_readtest.c:74:41: warning: Using plain integer as NULL pointer Signed-off-by: Hannes Eder <hannes@hanneseder.net> Acked-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: Jiri Kosina <jkosina@suse.cz>
* [MTD] [TESTS] Fix some size_t printk format warningsDavid Woodhouse2009-01-052-4/+4
| | | | Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
* MTD: add MTD tests to compilationArtem Bityutskiy2008-12-101-0/+7
| | | | | | Add MTD tests to Kconfig and Makefiles. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
* MTD: tests: add mtd_torturetestArtem Bityutskiy2008-12-101-0/+530
| | | | | | | This test is designed to work for very long time and it tries to wear few eraseblocks. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
* MTD: tests: add mtd_subpagetestArtem Bityutskiy2008-12-081-0/+525
| | | | | | This tests makes sure sub-pages on NAND MTD device work fine. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
* MTD: tests: add mtd_stresstestArtem Bityutskiy2008-12-081-0/+330
| | | | | | This test just performs random operations on random eraseblocks. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
* MTD: tests: add mtd_speedtestArtem Bityutskiy2008-12-081-0/+502
| | | | | | This test examines I/O speed of the flash device. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
* MTD: tests: add mtd_readtestArtem Bityutskiy2008-12-081-0/+253
| | | | | | A simple tests which reads whole MTD device one page at a time. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
* MTD: tests: add mtd_pagetestArtem Bityutskiy2008-12-081-0/+632
| | | | | | This test checks that NAND pages read/write work fine. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
* MTD: tests: add mtd_oobtestArtem Bityutskiy2008-12-081-0/+742
This test checks that OOB of a NAND MTD device works fine. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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